The ultimate tool for nanoscale research from biological molecules to advanced new materials.
The versatile mid-range research AFM that grows with your demands in modes and accessories.
A compact affordable research AFM that is astoundingly easy to use, with more than 30 modes and options.
Measure roughness and other material properties of heavy and large samples up to 300 mm and 45 kg.
Bringing the power of DriveAFM to a wafer metrology system purpose-built for the requirements of the semiconductor industry.
For unique requirements, we will design a bespoke AFM solution, leveraging our decades of engineering expertise.
Slide an AFM onto your upright optical microscope turret for a leap in resolution.
One of the smallest ever AFMs, created for integration into custom stages or existing setups.
A flexibly mountable research-grade scan head for integration into custom stages or existing set ups.
What is atomic force microscopy (AFM)? How does AFM work? What AFM modes do I really need? How do I get started with AFM?
Learn how AFM works with cantilever/tip assembly interacting with the sample. Explore CleanDrive technology, calibration methods, and feedback principles for precise nanoscale imaging.
An overview of common AFM modes. To learn about each mode in more detail and see application, view the full article.
We regularly publish detailed reviews providing practical guidance and theoretical background on various AFM applications.
Read detailed technical descriptions about selected AFM techniques and learn how to perform specific measurements on Nanosurf instruments.
A library of links to research papers in which Nanosurf instruments were used.
Learn AFM from our library of recorded webinars, covering different measurement techniques, modes, and areas of application.
Short video clips explaining how to perform different operations on Nanosurf instruments.
Watch a product demonstration to learn about the capabilities of our AFMs.
Short videos of our AFMs.
Browse news articles, press releases and a variety of other articles all around Nanosurf.
Browse Héctor Corte-Léon's weekly experiments, for inspiration, entertainment, and to discover everyday applications of AFM.
This application note follows up on a previous note about Scanning Microwave Microscopy measurements of a capacitance standard sample.
It focuses on using SMM to study a silicon SCM calibration sample from Infineon, containing both n and p-type dopants across a range of densities. The note details the use of two SMM modes: the S11 measurement and the dS/dV measurement. The S11 measurement is suitable for flat samples and is used for dopant density and dielectric constant measurements, while the dS/dV measurement, less affected by topography, provides information about dopant types through phase change.
Understanding SMM's Application in Dopant Density Determination: Learn how SMM is used to study dopant densities in semiconductor samples, focusing on the capabilities of the S11 and dS/dV measurement modes.
Exploring SMM Measurement Modes: Gain insights into the S11 measurement for dopant density and dielectric constant assessment, and the dS/dV measurement for identifying dopant types.
Analyzing Semiconductor Samples with SMM: Understand the process of characterizing semiconductor samples using SMM, including the calibration procedure and interpretation of measurement data.
Comparing SMM with Other Techniques: Recognize the advantages of SMM over other methods like Scanning Spreading Resistance Microscopy and Scanning Capacitance Microscopy in semiconductor analysis.
Applying SMM in Semiconductor Research: Learn about the practical applications of SMM in semiconductor research, particularly in studying samples with varying dopant types and densities.