Easy Moiré Pattern Imaging of 2D Materials with Photothermal Torsional Resonance AFM

This application note discusses the application of photothermal torsional resonance in Atomic Force Microscopy (AFM) for imaging Moiré patterns in 2D materials. This advanced technique provides high-resolution imaging capabilities by utilizing torsional resonances of the cantilever, which are excited using Nanosurf’s CleanDrive photothermal technology. This method is particularly effective for visualizing the periodic structures created when two 2D layers are overlaid at a specific angle, offering significant advantages in ease of use and resolution compared to other scanning probe techniques.

DOWNLOAD NOW

Learning Objectives

  1. Understand Moiré Patterns in 2D Materials: Learn the significance of Moiré patterns as indicators of the relative orientation of 2D material layers and their influence on material properties.
  2. Explore Torsional Resonance AFM: Gain knowledge about torsional resonance in AFM, including how the cantilever’s lateral movements enhance imaging resolution and sensitivity.
  3. Photothermal Excitation Techniques: Understand the role of CleanDrive photothermal excitation in achieving efficient and precise excitation of torsional modes in AFM cantilevers.
  4. Application of Torsional Resonance in Imaging: Learn how torsional resonance AFM can be applied to achieve high-resolution imaging of both atomic lattices and Moiré patterns, particularly in non-conductive samples and in liquid environments.
  5. Technical Implementation and Optimization: Explore how parameters such as excitation frequency and amplitude are optimized for torsional resonance imaging, and how these factors contribute to enhanced image quality and resolution.
Torsional-Resonance-Imaging