Flex-Mount
The Essential AFM for Custom Integration
Flex-Mount is a unique AFM that can be configured to acquire high-resolution information on large, non-planar and demanding samples. The Flex-Mount solution combines the superior resolution and performance of the Nanosurf FlexAFM scan head with the integrability of the Nanosurf NaniteAFM. The result is a tip-scanning AFM that can easily be attached to one of Nanosurf’s large, custom-built motorized translation stages and is thus able to characterize the surface of samples with weights and dimensions virtually no other AFM system can handle.
- Proven performance and reliability in industrial settings
- Tip scanning design for maximal flexibility
- Automation capabilities
- Purpose-built for integration
- Measure samples of any weight and dimensions
Research-Grade Scan Head for Integration
Flex-Mount is based on the FlexAFM, Nanosurf’s most widely used research scan head. The flexure-based tip scanner provides flat and linear scanning, high resolution, and stable operation.
Unlimited Freedom with Custom Stages
Large, Non-Planar, and Curved Samples
Flex-Mount, in combination with the right stage, will provide you with precise measurements on samples of any size. Tilting of the scan head, coupled with freedom of movement in any axes you require, will allow you to reach any sample area of interest easily also on curved samples.
Flex-Mount Features
Self-Aligning Cantilevers
24-bit Controller
Large Range of AFM Modes
Flat and Linear Scanner
100 μm Scan Range
Custom Stages
Easy to Use
Top- and Sideview Camera
No Sample Limitations
Flex-Mount Imaging Modes
Standard imaging modes
- Static Force Mode
- Lateral Force Mode
- Dynamic Force Mode (Tapping Mode)
- Phase Imaging Mode
Electrical properties
- Conductive AFM (C-AFM)
- Scanning Spreading Resistance Microscopy (SSRM)
- Piezoelectric Force Microscopy (PFM)
- Electrostatic Force Microscopy (EFM)
- Kelvin Probe Force Microscopy (KPFM)
- Scanning Microwave Microscopy (SMM)
- Magnetic Force Microscopy (MFM)
Mechanical properties
- Force Spectroscopy (Unfolding and Stretching, Adhesion)
- Force Modulation
- Force Mapping (Stiffness and Modulus, Adhesion)
Lithography and Nanomanipulation
Electrochemical AFM (EC-AFM)
Scanning Thermal Microscopy (SThM)
C3000 Control Software
- Cantilever calibration by Sader method and frequency sweep
- Highly configurable graph area with mode-dependent auto-layout: the software automatically shows the relevant graphs and information
- Easy file handling with comfort features: auto apply naming conventions, Windows Explorer integration, image gallery, bulk renaming.
- Includes a powerful scripting interface: automate and extend capabilities according to your needs.
- Compatible with most programming environments (e.g. LabView, Python, MatLab, C++, Java, and more)
- Spectroscopy wizard: follow easy steps to set up spectroscopy measurements
- One software UI for all scan heads: no additional learning curve if you use multiple Nanosurf AFM systems
Download the Flex-Mount Brochure
The PDF brochure includes details on the Flex-Mount technology, application examples for different areas of interest and system specifications.
Integration Examples
Motorized XYZΦ translation stage for extra large samples
Motorized XYZΦ translation stage for extra large samples
Description | Specification |
---|---|
Max. Traverse path X/Y/Z/Φ: | 230/485/20 mm / 360° |
Step size X/Y/Z/Φ: | 0.5/0.5/0.5 µm / 0.001° |
Step size X/Y/Z/Φ: | 0.5/0.5/0.5 µm / 0.001° |
Repositioning accuracy: | ± 1/1/1 µm / 0.001° |
Absolute accuracy: | ± 15 µm |
Max. velocity: | 30/30/3 mm/s / 7°/s |
Sample platform size: | ⌀500 mm |
Sample size: | ⌀500 mm × 80 mm |
Sample weight: | max. 20 kg |
Stage size: | 1350 mm × 950 mm × 1360 mm |
Stage weight: | 1300 kg |
Stage technology: | Linear motors, spindle-stepper motor, harmonic drive, air bearings |
Noise level: | < 40 pm |
Example Measurements
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Interested in Flex-Mount?
Get to know the Flex-Mount! Reach out to us to discuss your application with one of our AFM experts, discuss your needs for a budgetary quote or schedule an exploratory meeting to learn more about integration possibilities.